
The XP Screen provides 96 of the most prominent crystallization conditions upgraded with the Anderson−Evans polyoxotungstate [TeW6O24]6− (TEW) at 1 mM final concentration. This additive has proven to promote crystal contacts, improve crystal quality and further provides a valuable anomalous signal for phasing due to 6 tungsten atoms. Optimized for TEW stability, the XP Screen improves crystallization and crystal diffraction quality of challenging targets.
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Regulatory Status |
RUO – Research Use Only |
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